Handling Instructions & Protection Against Electrostatic Discharges:  Application Note Microsemi-formerly Advanced Power Technology APT0502  ( app note added 05/07)

Hardware histogram speeds ADC test:  11/13/03 EDN Design Ideas  /  (added 1/05)  Accumulating enough samples to effectively and accurately measure linearity errors in pipeline converters at production test and minimizing test time are difficult enough. Add to that multiple sites, multiple channels, and the expense of multiple custom-instrument resources during periods of low capital expenditure, and engineers must think creatively to increase throughput without sacrificing ......

High impedance FET probe extends RF Spectrum analyzer's usable range:  02/05/2004  EDN-Design Ideas  In low-noise analog circuits, a high-gain amplifier serves at the input to increase the SNR. The input signal level determines the input-stage gain; low-level signals require the highest gain. It is also standard practice in low-noise analog-signal processing to make the circuit's bandwidth as narrow as possible to pass only the useful input-signal spectrum. (added 10/05)

High Impedance Voltmeter:  (schematic / circuit added 05/07)

High Precision Rail-to-Rail Output Operational Amplifier:  National Semiconductor Application Note LMV2001 April 2004 (app note added 02/05)

High Resistance Voltmeter:  (electronic circuit added 10/05)

High side Current monitor operates at high Voltage:  07)/22/04  EDN Design Ideas Online (added 1/05) The simplest technique for measuring current in an actuator or a motor is to monitor the ground current with a resistive element between the load and the ground. Because the device and its associated electronics share a ground potential, you need to amplify only the ground-current 

High side Current sense causes little error:  0316/95 EDN-Design Ideas / (added 2/06)

High side Current sensing switched mode regulator provides constant Current LED drive:  04/14/05 EDN Design Ideas  / (added 2/06)  Drive LEDs with constant-current source.

High Side Current Sensor has Period Output 1:  Maxim APP 1084: May 31, 2002 / (app note added 8/03)

High-Side Current Sensing: Considerations and Applications for High-Side Current Monitoring:  Zetec Semiconductors  Applications Notes  A guide for using the ZXCT range of products. Contained within the note are application ideas for extended supply ranges, a circuit for bi-directional current sensing and an over-current/short circuit protection circuit. Now updated and contained within AN39   (app note added 2/06)

How to read a supeR10 trace:  AN1979 The purpose of This AppNote is to give to the user all the keys to read and interpret the information shown in a Super10 Bondout trace and especially the timestamps....AN1979 -AN1979 -AN1979 APPLICATION... (app note added 6/06)

HV430 105 Volt RMS Ring Generator:  Supertex Semiconductors  (app note added 2/06)

IEC Compliant Active-Energy Meter Design using the MCP3905/6(Chinese):  Microchip Application Note Published 17-Oct-05   (app note added 6/06)

IEC Compliant Active-Energy Meter Design using the MCP3905/6:  Microchip Application Note Published 27-Jul-05   (app note added 6/06)

Improved current monitor delivers proportional-voltage output:  1/19/2006    EDN Design Ideas  / (added 05/07)    New, improved circuit delivers an accurate linear-voltage output proportional to current in primary winding.

Improved ESD immunity against interrupTS lock-up:  A whole set of extremely efficient protection guidelines are already described in the other AN1015. An additional software hardening technique will be described here to improve sotware robustness even further, when many interrupts are running concurrently and, if... (app note added 6/06)

Improved Kelvin contacts boost Current sensing accuracy by an order of magnitude:  02/17/05 EDN Design Ideas  / (added 5/05)  Many power-supply designs rely on accurately sensing the voltage across a current-sense element. Multiphase regulators use the sense voltage to force current sharing among phases, and single-phase regulators to control the current-limit setpoint. As internal complexity and clock speeds increase, processors impose narrower operating margins for power-supply voltages and currents, which in turn m...

Improved two-tone, third order testing:  Application Note MiniCircuits.com  (app note added 6/06)

In Circuit Electrolytic Tester:  (electronic schematic / circuit added 4/02)

Indicator features expanded scale:  02/21/02 EDN Design Ideas  /  (added 1/05)  Test equipment for a production line should be user-friendly (read "idiot-proof") and should offer minimal test time. In many cases, the test fixture must give an operator only one answer: pass or fail. Usually, two indicators assume this role: green for pass and red for fail. In most applications, a sensor transforms the tested parameter to a voltage; the test fixture must measure this v... ...

Inductance meter :   (added 6/07)

Infrared Remote Control Tester #1:  measures the relative intensities of different Infrared light sources (added 5/02)

Infrared Remote Control Tester:  (electronic Circuit / Schematic added 10/04)

Integrator Forms Picoammeter:  07)/17/97 EDN-Design Ideas  / (added 3/03)   

Introduction to Time, Frequency and Modal Domains (5988-6765EN):  Aligent Application Note 1405-1 (added 4/08)

Invisible Broken Wire Detector:  Circuit / schematic (added 02/05)

IR Remote Control Tester:  (circuit / schematic design added 6/06)

IRDCiP1202-A 300kHz Dual 15A 5.5VIN to 13.2VIN Dual Output Synchronous Buck Converter using iP1202:  This board allows engineers to easily evaluate the iP1202 in an independent and parallel configuration that is capable of providing up to 15A per phase with double-sided heat sinking.  (added 3/05)

IRDCiP2001-A 500kHz 40A 2-phase Synchronous Buck Converter using iP2001:  This board enables engineers to easily evaluate the iP2001 in a 2-phase configuration that is capable of providing up to 40A in a lab environment without airflow.  (added 3/05)

Jitter Measurement Techniques:  Pericom Semiconductor Application Brief # 036 (app note added 2/05)

Jitter Measurements using Eye Patterns Test Report #1:  National Semiconductor Application Note   (app note added 2/06)

Keys to Longer Life for CMOS:  AN-349 Analog Devices Application Notes  (app note added 6/06)  Here's How CMOS Can be Protected Against Abuse